The Shimadzu UV-1800 UV-Vis spectrophotometer is one of the most sold instruments to date and includes high resolution, compact design and user friendly access to data. Read more about the instrument here.
Shimadzu UV-1800 UV-Vis Spectrophotometer
Specifications of the Shimadzu UV-1800:
| Full Name: | Shimadzu UV-1800 |
| Brand: | Shimadzu |
| Model: | UV-1800 |
| Type: | Scanning |
| Beam Z height (nm): | 15 |
| Min (nm): | 190 |
| Max (nm): | 1100 |
| Minimum spectral bandwidth (nm): | 1 |
| Wavelength accuracy (nm): | 0.1 |
| Wavelength reproducibility (nm): | 0.1 |
| Max scanning speed (nm): | 3000 |
| Connectivity interface: | USB |
| NanoCuvette™ One compatible: | Yes |
| SpectroLink™ compatible: | Yes |
| SpectroWorks™ compatible: | Yes |
Shimadzu UV-1800 UV-Vis Spectrophotometer
Shimadzu is a leader in the development of advanced technologies, which clearly comes to expression in the Shimadzu UV-1800 spectrophotometer. The most important features of UV-1800 include high resolution, compact design and user friendly access to data. The UV-1800 spectrophotometer is equipped with various measurement modes including photometric, spectrum, kinetics, time-scan, quantitation, multi-component quantification and biomethod. The advanced features and various measurement modes make the UV-1800 ideal for many applications.
Watch the video below for a guide to the UV-1800.
Features of the UV-1800 include:
- High Resolution
The UV-1800 achieves a resolution of 1 nm, which is the highest level of wavelength resolution in its class.
- Compact and Space Saving Design
The UV-1800 is only 450 mm wide and 490 mm deep making it one of the most compact instruments in its class. - User Friendly Access to Data
The UV-1800 features a USB port. The instrument can therefore be controlled with a PC.
Shimadzu UV-1800 with high resolution
The UV-1800 achieves a resolution of 1 nm, which at the same time is the highest level of wavelength resolution in its class. Additionally a spectroscope with a Czerny-Turner mounting can be used in order to get a compact, bright optical system. Furthermore, wavelength repeatability, stray light and baseline stability have also been optimized in order to meet user requirements.
Because of these features, the UV-1800 has no problems with satisfying the standards of wavelength resolution demanded by the Japanese- and European Pharmacopoeia.
Shimadzu UV-1800 with a compact design
The UV-1800 is one of the most compact instruments in its class. The UV-1800 design has been optimized in relation to width and depth. Therefore, the UV-1800 is only 450 mm wide and 490 mm deep, allowing installation in tight spaces. The space saving design of UV-1800 makes the instrument ideal for even small laboratories.
Shimadzu UV-1800 with user friendly access to data
Furthermore, data for spectra and time-course curves can be displayed and saved with commercial spreadsheet software. The user can also choose to print from a printer that supports PCL control codes.
Shimadzu UV-1800 compared to other instruments
The UV-1800 is not only a huge upgrade from previous Shimadzu instruments, as it also beats its competitors on several parameters. The Shimadzu UV-1800 is more accurate than both Analytik Jena Spekol 2000 UV-Vis and Jenway 6550 UV-Vis.
Features of the UV-1800 compared to other instruments include:
Shimadzu UV-1800 versus Analytik Jena Spekol 2000 UV-Vis
- The Shimadzu UV-1800 is more accurate than Analytik Jena Spekol 2000 UV-Vis.
Shimadzu UV-1800 versus Jenway 6850 UV-Vis
- The Shimadzu UV-1800 is more accurate than Jenway 6850 UV-Vis.
Shimadzu UV-1800 with NanoCuvette™ One, SpectroLink™, and SpectroWorks™
The NanoCuvette™ One is a cuvette that can be used for measuring both refractive index and absorbance using a spectrophotometer.
Compatibility of Shimadzu UV-1800 with cphnano products:
This information is meant for guidance only. Copenhagen Nanosystems ApS takes no responsibility or liability for the information provided. Please write to sales@cphnano.com if you want to add your UV-Vis instrument to the list or let us know of any mistakes.